Miller D.J., Rupich M., Welp U., Fleshler S., Civale L., Ghigo G., Laviano F., Kwok W.K., Kayani A., Leroux M., Eley S., Kihlstrom K.J., Niraula P.
Miller D.J., Rupich M.W., Welp U., Civale L., Kwok W., Kayani A., Leroux M., Eley S., Niraula P.M., Sheng H.
Rupich M.W., Sathyamurthy S., Fleshler S., Li Q., Solovyov V., Ozaki T., Welp U., Kwok W., Leroux M., Koshelev A.E., Miller D.J., Kihlstrom K., Civale L., Eley S., Kayani A.
Miller D.J., Rupich M.W., Welp U., Fleshler S., Sathyamurthy S., Civale L., Kayani A., Leroux M., Eley S., Niraula P.M., Kwok W.-K., Kihlstrom K.J., Holleis S., Sheng H.P.
Miller D.J., Rupich M.W., Li X., Malozemoff A.P., Welp U., Fleshler S., Sathyamurthy S., Civale L., Kwok W.K., Jia Y., Kayani A., Leroux M., Wen J.G., Ayala-Valenzuela O.
Miller D.J., Zhang Y., Selvamanickam V., Chen Y., Majkic G., Guevara A., Shi T., Yao Y., Lei C., Galtsyan E.
Ключевые слова: HTS, YBCO, doping effect, REBCO, coated conductors, composition, microstructure, pinning, critical caracteristics, angular dependence, critical current, experimental results
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Ключевые слова: presentation, HTS, YBCO, coated conductors, MOD process, MOCVD process, comparison, microstructure, doping effect, fabrication, defects, nanoscaled effects, critical caracteristics, critical current density, angular dependence, phase composition, Raman spectroscopy, defects columnar, critical current
Ключевые слова: HTS, YBCO, REBCO, coated conductors, RABITS process, TFA-MOD process, fabrication, Raman spectroscopy, phase formation, thickness dependence, time evolution
Ключевые слова: presentation, collaborations, funding, critical caracteristics, critical current, homogeneity, long conductors, thickness dependence, HTS, MOD process, YBCO, nucleation, growth rate, fabrication, interfaces, magnetic field dependence, films thick, resistivity, temperature dependence, Jc/B curves, pinning force, RABITS process, experimental results, coated conductors
Ключевые слова: patents, fabrication, ISD process, HTS, YBCO, coated conductors, buffer layers, deposition setup, substrate metallic
Ключевые слова: HTS, coated conductors, MOD process, YBCO, nucleation, fabrication, thickness dependence, critical caracteristics, RABITS process, plans, funding, presentation
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, long conductors, critical caracteristics, fabrication, doping effect, plans, funding, presentation
Miller D.J., Maroni V.A., Rupich M.W., Li X., Specht E.D., Christen D.K., Larbalestier D.C., Sathyamurthy S., Thompson J.R., Feenstra R., Xu A., Sinclair J.
Miller D.J., Maroni V.A., Li X., Rupich M., Chen Z., Sathyamurthy S., Feenstra R., Zaluzec N.J., Cooley K.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, RABITS process, buffer layers, fabrication, grain alignment, MOD process, ex-situ process, microstructure
Ключевые слова: HTS, YBCO, coated conductors, funding, fabrication, microstructure, microstructure, measurement technique, nucleation, MOD process, plans, collaborations, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, TFA-MOD process, fluorine process, electron beam evaporation, Raman spectroscopy, nucleation, microstructure, phase formation, template layers, surface, critical current density, thickness dependence, seed layers, critical caracteristics, measurement technique
Ключевые слова: HTS, YBCO, coated conductors, fabrication, TFA-MOD process, fluorine process, electron beam evaporation, Raman spectroscopy, nucleation, microstructure, phase formation, template layers, surface, critical current density, thickness dependence, seed layers, funding, plans, collaborations, critical caracteristics, measurement technique, presentation
Miller D.J., Maroni V.A., Li X., Zhang W., Kodenkandath T., Chen Z., Holesinger T.G., Larbalestier D.C., Feenstra R., Coulter J.Y., Civale L., Maiorov B., Feldmann D.M., Huang Y.
Ключевые слова: HTS, YBCO, coated conductors, nanoscaled effects, microstructure, chemical solution deposition, fabrication, nucleation, porosity, critical current, n-value, homogeneity, thickness dependence, pinning force, MOD process, critical current density, angular dependence, RABITS process, PLD process, Jc/B curves, critical caracteristics
Ключевые слова: HTS, wires, coils, plans, critical current, long conductors, review, presentation, collaborations, power equipment, critical caracteristics
Ключевые слова: presentation, HTS, YBCO, coated conductors, fabrication, RABITS process, MOD process, critical current, thickness dependence, angular dependence, precursors, microstructure, pinning, defects, grain boundaries, nucleation, Jc/B curves, dissipative properties, irreversibility fields, nanoscaled effects, pinning force, magnetic field dependence, review, critical caracteristics, magnetic properties
Ключевые слова: presentation, HTS, YBCO, coated conductors, long conductors, high rate process, fabrication, microstructure, nucleation, IBAD process, MOCVD process, REBCO
Ключевые слова: HTS, YBCO, coated conductors, fluorine process, fabrication, phase formation, Raman spectroscopy, measurement technique
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Miller D.J., Maroni V.A., Rupich M.W., Li X., Kodenkandath T., Holesinger T.G., Civale L., Maiorov B., Huang Y., Arenal R.
Ключевые слова: HTS, coated conductors, long conductors, MOD process, microstructure, defects, YBCO, MOD process, fabrication, pinning, presentation, measurement technique
Ключевые слова: HTS, YBCO, coated conductors, MOD process, pinning, defects, microstructure, doping effect, presentation, fabrication
Ключевые слова: HTS, YBCO, coated conductors, long conductors, microstructure, homogeneity, defects, presentation, length
Ключевые слова: patents, HTS, YBCO, coated conductors, ISD process, fabrication, PLD process, substrate metallic
Balachandran U.(balu@anl.gov), Miller D.J., Maroni V.A., Vlasko-Vlasov V., Welp U., Gray K.E., Reeves J., Claus H., Trasobares S., Lei Y., Hiller J.M.
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Miller D.J., Maroni V.A., Rupich M.W., Li X., Zhang W., Kodenkandath T., Gray K.E., Reeves J., Vlasko-Vlasov V.K., Claus H., Trasobares S., Lei Y., Hiller J.M., Venkataraman K.(venkataraman@wisc.edu)
Koritala R.E., Fisher B.L., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U., Berghuis P., Gray K.E., Ma B.(bma@anl.gov), Uprety K.K.
Venkataraman K., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Lynch J., Scudiere J., Verebelyi D.T., Holesinger T.G., Rupich M.W.(mrupich@amsuper.com), Teplitsky M., Maroni V., Miller D.
Ключевые слова: HTS, coated conductors, RABITS process, MOD process, YBCO, substrate Ni-W, fabrication, microstructure, critical current density, review, critical caracteristics
Li M., Ma B., Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Baurceanu R., Dorris S.E., Miller D.J., Balachandran U.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, template layers, fabrication, magnetic properties
Li M., Ma B., Koritala R.E., Fisher B.L., Balachandran U.(balu@anl.gov), Dorris S.E., Miller D.J.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, ISD process, PLD process, microstructure, experimental results, fabrication, magnetic properties
Fisher B.L., Miller D.J., Balachandran U., Koritala R.E.(koritala@anl.gov), Beihai M., Meiya L.
Ключевые слова: HTS, YBCO, coated conductors, template layers, buffer layers, ISD process, microstructure, fabrication, substrate Ni-V
Koritala R.E., Fisher B.L., Markowitz A.R., Erck R.A., Dorris S.E., Miller D.J., Balachandran U., Meiya L., Beihai M.(bma@anl.gov)
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